Magnetic microscopy with small scale Hall probes (invited) (abstract)
Identifieur interne : 001B36 ( France/Analysis ); précédent : 001B35; suivant : 001B37Magnetic microscopy with small scale Hall probes (invited) (abstract)
Auteurs : RBID : Pascal:98-0460708Descripteurs français
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- 7525, 6116C, 7472, 7425H, 7570C, 7340K, 7361, Méthode mesure, Gallium arséniure, Aluminium composé, Indium composé, Semiconducteur III-V, Hétérojonction semiconducteur, Bismuth, Couche mince métallique, Structure magnétique, Microscopie force magnétique, Effet Hall, Bruit, Supraconducteur haute température.
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Abstract
The use of small scale Hall probes in the study of nanometer scale magnetic structures and high temperature superconductors is discussed. Micron sized Hall probes are a powerful means of studying local magnetic properties and are complementary to other local magnetometry methods such as those based on magnetic force microscopy and superconducting quantum interference device techniques. In addition to presenting an overview of our recent studies on nanofabricated magnetic samples and ring shaped superconductors, we discuss the factors that determine the spatial and field resolution of this technique. Among the important issues considered are the Hall response to inhomogeneous magnetic fields and the noise characteristics of sensor materials. A variety of materials have been studied including two-dimensional GaAs/GaAlAs heterostructures, three-dimensional InGaAs, and Bi semimetal thin films. Finally, our progress toward the realization of a variable temperatures scanning Hall probe microscope will be reported. © 1997 American Institute of Physics.
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Kent</name><affiliation wicri:level="2"><inist:fA14 i1="01"><s1>Department of Physics, New York University, New York, New York 10003</s1><sZ>1 aut.</sZ><sZ>2 aut.</sZ></inist:fA14><country xml:lang="fr">États-Unis</country><placeName><region type="state">État de New York</region></placeName><wicri:cityArea>Department of Physics, New York University, New York</wicri:cityArea></affiliation><affiliation wicri:level="1"><inist:fA14 i1="02"><s1>Centre de Recherches sur les Tres Basses Temperatures, CNRS, Grenoble, France</s1></inist:fA14><country xml:lang="fr">France</country><wicri:regionArea>Centre de Recherches sur les Tres Basses Temperatures, CNRS, Grenoble</wicri:regionArea><placeName><region type="région">Rhône-Alpes</region><settlement type="city">Grenoble</settlement></placeName></affiliation></author><author><name sortKey="Charalambous, Melissa" uniqKey="Charalambous M">Melissa Charalambous</name><affiliation wicri:level="2"><inist:fA14 i1="01"><s1>Department of Physics, New York University, New York, New York 10003</s1><sZ>1 aut.</sZ><sZ>2 aut.</sZ></inist:fA14><country xml:lang="fr">États-Unis</country><placeName><region type="state">État de New York</region></placeName><wicri:cityArea>Department of Physics, New York University, New York</wicri:cityArea></affiliation></author></titleStmt><publicationStmt><idno type="inist">98-0460708</idno><date when="1997-04-15">1997-04-15</date><idno type="stanalyst">PASCAL 98-0460708 AIP</idno><idno type="RBID">Pascal:98-0460708</idno><idno type="wicri:Area/Main/Corpus">016432</idno><idno type="wicri:Area/Main/Repository">017E89</idno><idno type="wicri:Area/France/Extraction">001B36</idno></publicationStmt><seriesStmt><idno type="ISSN">0021-8979</idno><title level="j" type="abbreviated">J. appl. phys.</title><title level="j" type="main">Journal of applied physics</title></seriesStmt></fileDesc><profileDesc><textClass><keywords scheme="KwdEn" xml:lang="en"><term>Aluminium compounds</term><term>Bismuth</term><term>Gallium arsenides</term><term>Hall effect</term><term>High-Tc superconductors</term><term>III-V semiconductors</term><term>Indium compounds</term><term>Magnetic force microscopy</term><term>Magnetic structure</term><term>Measuring methods</term><term>Metallic thin films</term><term>Noise</term><term>Semiconductor heterojunctions</term></keywords><keywords scheme="Pascal" xml:lang="fr"><term>7525</term><term>6116C</term><term>7472</term><term>7425H</term><term>7570C</term><term>7340K</term><term>7361</term><term>Méthode mesure</term><term>Gallium arséniure</term><term>Aluminium composé</term><term>Indium composé</term><term>Semiconducteur III-V</term><term>Hétérojonction semiconducteur</term><term>Bismuth</term><term>Couche mince métallique</term><term>Structure magnétique</term><term>Microscopie force magnétique</term><term>Effet Hall</term><term>Bruit</term><term>Supraconducteur haute température</term></keywords><keywords scheme="Wicri" type="concept" xml:lang="fr"><term>Bismuth</term><term>Bruit</term></keywords></textClass></profileDesc></teiHeader><front><div type="abstract" xml:lang="en">The use of small scale Hall probes in the study of nanometer scale magnetic structures and high temperature superconductors is discussed. Micron sized Hall probes are a powerful means of studying local magnetic properties and are complementary to other local magnetometry methods such as those based on magnetic force microscopy and superconducting quantum interference device techniques. In addition to presenting an overview of our recent studies on nanofabricated magnetic samples and ring shaped superconductors, we discuss the factors that determine the spatial and field resolution of this technique. Among the important issues considered are the Hall response to inhomogeneous magnetic fields and the noise characteristics of sensor materials. A variety of materials have been studied including two-dimensional GaAs/GaAlAs heterostructures, three-dimensional InGaAs, and Bi semimetal thin films. Finally, our progress toward the realization of a variable temperatures scanning Hall probe microscope will be reported. © 1997 American Institute of Physics.</div></front></TEI><inist><standard h6="B"><pA><fA01 i1="01" i2="1"><s0>0021-8979</s0></fA01><fA02 i1="01"><s0>JAPIAU</s0></fA02><fA03 i2="1"><s0>J. appl. phys.</s0></fA03><fA05><s2>81</s2></fA05><fA06><s2>8</s2></fA06><fA08 i1="01" i2="1" l="ENG"><s1>Magnetic microscopy with small scale Hall probes (invited) (abstract)</s1></fA08><fA11 i1="01" i2="1"><s1>KENT (Andrew D.)</s1></fA11><fA11 i1="02" i2="1"><s1>CHARALAMBOUS (Melissa )</s1></fA11><fA14 i1="01"><s1>Department of Physics, New York University, New York, New York 10003</s1><sZ>1 aut.</sZ><sZ>2 aut.</sZ></fA14><fA14 i1="02"><s1>Centre de Recherches sur les Tres Basses Temperatures, CNRS, Grenoble, France</s1></fA14><fA20><s2>p. 5018</s2></fA20><fA21><s1>1997-04-15</s1></fA21><fA23 i1="01"><s0>ENG</s0></fA23><fA43 i1="01"><s1>INIST</s1><s2>126</s2></fA43><fA44><s0>8100</s0><s1>© 1998 American Institute of Physics. All rights reserved.</s1></fA44><fA47 i1="01" i2="1"><s0>98-0460708</s0></fA47><fA60><s1>P</s1><s2>C</s2><s3>E</s3></fA60><fA61><s0>A</s0></fA61><fA64 i2="1"><s0>Journal of applied physics</s0></fA64><fA66 i1="01"><s0>USA</s0></fA66><fC01 i1="01" l="ENG"><s0>The use of small scale Hall probes in the study of nanometer scale magnetic structures and high temperature superconductors is discussed. Micron sized Hall probes are a powerful means of studying local magnetic properties and are complementary to other local magnetometry methods such as those based on magnetic force microscopy and superconducting quantum interference device techniques. In addition to presenting an overview of our recent studies on nanofabricated magnetic samples and ring shaped superconductors, we discuss the factors that determine the spatial and field resolution of this technique. 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